MARSURF M 400 Mobile Surface Measuring instrument

MARSURF M 400 MOBILE SURFACE MEASURING INSTRUMENT

Mobile and stationary measuring instrument. Roughness and waviness measurements. Traversing lengths up to 26 mm. Over 50 R, W and P surface parameters. Automatic choice of cut-off and traversing length in accordance with international standards. Dynamic calibration function. Cable and the Bluetooth connection between the drive unit and evaluation instrument (4 m). Magnetic probe holder

Applications

Machine building

- Bearings, shafts, racks, valves

Automotive industry

- - Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger

Steel industry

- - - Measurement of sheet metal surfaces
    - Measurement of the roller surface
  Medicine
  - - Surface roughness measurement for hip and knee endoprostheses
    - Aerospace
      - Turbine components

Accessories

Measuring stand

ST-D, ST-F, and ST-G
Holder on measuring stand

Other accessories

CT 120 XY table, parallel vise, V-block
Assorted probe arms for the BFW probe system

Shipment

MarSurf M 400 evaluation instrument
MarSurf SD 26 drive unit including BFW 250 probe system
Standard probe arm (6852403)
1 roll of thermal paper
Wide-range power supply unit with 3 adapters
2 USB cables (for connecting to the PC and the M 400)
Operating instructions
With a Case

Mobile and stationary measuring instrument.
Roughness and waviness measurements.
Traversing lengths up to 26 mm.
Over 50 R, W and P surface parameters.
Automatic choice of cut-off and traversing length in accordance with international standards.
Dynamic calibration function.
Cable and the Bluetooth connection between the drive unit and evaluation instrument (4 m).
Magnetic probe holder (breakaway probe) BFW 250.
Motorized probe zero setting (max. 7.5 mm).

Technical Data

Measuring principle	Stylus method
Probe	BFW skidless system
Measuring range mm	+/- 250 µm (up to +/- 750 µm with 3x probe arm length)
Profile resolution	Measuring range +/- 250 µm: 8 nm Measuring range +/- 25 µm: 0.8 nm
A filter according to the ISO/JIS	Gaussian filter as per ISO 11562 A filter as per ISO 13565
Number n of sampling length according to ISO/JIS	1-5
Contacting speeds	0,2 mm/s; 1,0 mm/s
Measuring force (N)	0.75 mN
Weight drive unit	approx. 0.9 kg
Weight measuring instrument	approx. 1.0 kg
Surface parameters	Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)