MARSURF M 400 MOBILE SURFACE MEASURING INSTRUMENT

Mobile and stationary measuring instrument. Roughness and waviness measurements. Traversing lengths up to 26 mm. Over 50 R, W and P surface parameters. Automatic choice of cut-off and traversing length in accordance with international standards. Dynamic calibration function. Cable and the Bluetooth connection between the drive unit and evaluation instrument (4 m). Magnetic probe holder

Applications

Machine building

    • Bearings, shafts, racks, valves

Automotive industry

      • Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger

                                   Steel industry

        • Measurement of sheet metal surfaces
        • Measurement of the roller surface

                      Medicine

        • Surface roughness measurement for hip and knee endoprostheses

        • Aerospace

          • Turbine components

Accessories

Measuring stand

  • ST-D, ST-F, and ST-G
  • Holder on measuring stand

Other accessories

  • CT 120 XY table, parallel vise, V-block
  • Assorted probe arms for the BFW probe system

Shipment

  • MarSurf M 400 evaluation instrument
  • MarSurf SD 26 drive unit including BFW 250 probe system
  • Standard probe arm (6852403)
  • 1 roll of thermal paper
  • Wide-range power supply unit with 3 adapters
  • 2 USB cables (for connecting to the PC and the M 400)
  • Operating instructions
  • With a Case
  • Mobile and stationary measuring instrument.
  • Roughness and waviness measurements.
  • Traversing lengths up to 26 mm.
  • Over 50 R, W and P surface parameters.
  • Automatic choice of cut-off and traversing length in accordance with international standards.
  • Dynamic calibration function.
  • Cable and the Bluetooth connection between the drive unit and evaluation instrument (4 m).
  • Magnetic probe holder (breakaway probe) BFW 250.
  • Motorized probe zero setting (max. 7.5 mm).
SURFACE MEASURING INSTRUMENT SURFACE MEASURING INSTRUMENT

Technical Data

Measuring principle
Stylus method
Probe
BFW skidless system
Measuring range mm
+/- 250 µm (up to +/- 750 µm with 3x probe arm length)
Profile resolution
Measuring range +/- 250 µm: 8 nm
Measuring range +/- 25 µm: 0.8 nm
A filter according to the ISO/JIS
Gaussian filter as per ISO 11562
A filter as per ISO 13565
Number n of sampling length according to ISO/JIS
1-5
Contacting speeds
0,2 mm/s; 1,0 mm/s
Measuring force (N)
0.75 mN
Weight drive unit
approx. 0.9 kg
Weight measuring instrument
approx. 1.0 kg
Surface parameters
Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)